This manual is intended as a tutorial and reference for individuals who will use the xp1 or xp2 to inspect and analyze sample surfaces, and as a general guide to configuration and maintenance of the instrument. Operators manual for xpplus series, ambios technology, october 2007. Nanostructured copper oxides as ethanol vapour sensors. The xp2 is a stylus type surface profilometer and as such is intended for very high z resolution measurements of surface topography on a wide variety of samples. Highly efficient quaternary organic photovoltaics by. The effects of their use in cdte solar cells were studied by amps1d software simulation using experiment values obtained from zno, ito, and sno 2. The thickness of the tin thin films was determined by profilometry using an ambios technology xp2 stylus profiler santa cruz, ca, usa. Payments are expected within 5 days after the offer is closed. The xp2 uses a diamond stylus to lightly contact the surface.
Contact us if you have any questions about our products and we will do best to answer. P10, p11, p12, p15, p20, p22 series surface profilers. Study on convex grating in hyperspectral imaging spectrometers. The thickness measurement of the prepared films was carried out using ambios technology xp2 stylus profiler. Ambios technology 1 1 introduction this manual describes in detail the operation of the ambios technology xp stylus profiler.
The thickness of the tin thin films was determined by profilometry using an ambios technology xp 2 stylus profiler santa cruz, ca, usa. Ambios xp2 technology stylus profiler meteinstrumen. The upside down solvent vapor annealing treatment and thermal annealing treatment on active layers were sequentially carried out to optimize the phase separation degree, and. Table of contents institute of microelectronics manualzz. Electronic supplementary information molecule solar cells. Step height comparison by non contact optical profiler. Ambios technology xp2 stylus profiler specifications profiler specifications system configuration sample stage diameter.
This manual is intended as a tutorial and reference for individuals who will use the xp 1 or xp 2 to inspect and analyze sample surfaces, and as a general guide to configuration and maintenance of the instrument. The optical transmission was measured by uvvis spectrometer perkin elmer inc. We love our international customers and would love to have your business but due to the nature of the used equipment, and that all items are untested and used, all sales are final. A comparative analysis of the structure and properties of these oxide films was then carried out. Vision software algorithm, for the measurement of step height, two lines are. Materials free fulltext thickness influence on in vitro. A comparative analysis of the structure and properties of. Location samtel center for display and technology scdt, clean room p2. It features the ability to measure precision step heights from under 10 angstroms to as large as 1. Remove the clamps on the top of the crate and lift off the lid of the crate. Please contact us for additional information and pricing. Steps exceeding 100 m require special precautions to prevent stylus damage. Diamond as a scaffold for bone growth pdf free download. All measurements were done through hole beginning after 1 mm from top surface.
Lift off the crate top from the base straight up use two people to ensure that the instrument is not hit while removing the lid and place aside. Atomic force microscope afm images were obtained using a nanoscope iii digital instruments atomic force microscope in tapping mode. The electrode size was measured by an ambios technology xp 2 stylus profiler, as shown in fig. Jan, 2016 the thickness of the tin thin films was determined by profilometry using an ambios technology xp 2 stylus profiler santa cruz, ca, usa. The thickness of each film was measured with a stylus profiler xp2, ambios technology inc. The xp 2 uses a diamond stylus to lightly contact the surface.
The electrode size was measured by an ambios technology xp2 stylus profiler, as shown in fig. Ambios profilometer is a computerized, high sensitivity surface profiler that. The xp 2 is a stylus type surface profilometer and as such is intended for very high z resolution measurements of surface topography on a wide variety of samples. From the simulation, we confirmed the increase of e ff, ff, v oc, and i sc by the introduction of itozno and itosno 2 layers in cdte solar cells.
Interface study of itozno and itosno2 complex transparent. The xp100 profilometer provides an affordable, high resolution surface. The effects of cold and cryogenic treatments on the. The coating thickness was evaluated by step profilometry using a stylus profiler xp2 system ambios technology, santa cruz, california, u. Microscopy laboratory room no19new building, institute of microelectronics description. The absorption spectra of films were obtained by a shimadzu uv3101pc spectrometer. Synthesis, processing and characterization of nanoscale multi. Ambios technology xp 2 stylus profiler specifications profiler specifications system configuration sample stage diameter. The thickness measurement of the prepared films was carried out using ambios technology xp 2 stylus profiler. The xpplus stylus profiler is a computerized, high sensitivity surface. High cost, value unit acquired from a reliable source.
The ambios xp2 surface profiler is a stylus profiler for mesuring submicrometric features and save profiles. Ambios xp2 montana microfabrication facility montana. Pdf lensless phase microscopy using phase retrieval with. The et ching depths were measure d by ambios xp 2 stylus profiler.
Ambios xp2 is a standard stylus profilometer for measuring step heights in the tens of nm up to 400 um. The profilometry measurements were performed at rt, on films deposited onto glass substrates. The trpl spectra were measured by using a fluorocube01nl. The upside down solvent vapor annealing treatment and thermal annealing treatment on active layers were sequentially carried out to optimize the phase separation degree, and the detailed descriptions are shown in fig. Thickness influence on in vitro biocompatibility of titanium. Ambios xp2 profiler infrastrucure of nanostructures and. In the following ex periments, th e accelerate voltage was 260v a nd ion beam density was 0. The xps and ups were measured by the multifunctional xray photoelectron spectroscopy axis, kratos analytical inc. In this study, a stylus profilometer ambios, xp2 was used to measure the thickness of the oxide thin films.
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